Analysis of Thin Surface Films by Spectroscopic Ellipsometry.
نویسندگان
چکیده
منابع مشابه
Spectroscopic ellipsometry of metal phthalocyanine thin films.
Optical functions of cobalt phthalocyanine, nickel phthalocyanine (NiPc), and iron phthalocyanine (FePc) have been determined by use of spectroscopic ellipsometry in the spectral range 1.55-4.1 eV (300-800 nm). The samples were prepared by evaporation onto glass and silicon substrates. The optical functions were determined by point-to-point fit. Absorption spectra were also measured. The index-...
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ژورنال
عنوان ژورنال: Materia Japan
سال: 1997
ISSN: 1340-2625,1884-5843
DOI: 10.2320/materia.36.337